An analysis of electro-optic measurement of electric fields using Jones matrix formulation

Huma Ismail; Ampalavanapillai Nirmalathas; Efstratios Skafidas

doi:10.1117/12.904488

7 December 2011 An analysis of electro-optic measurement of electric fields using Jones matrix formulation

Huma Ismail, Ampalavanapillai Nirmalathas, Efstratios Skafidas

Proceedings Volume 8308, Optoelectronic Materials and Devices VI; 83081H (2011) https://doi.org/10.1117/12.904488
Event: SPIE/OSA/IEEE Asia Communications and Photonics, 2011, Shanghai, China

Abstract

We present an analysis of polarization sensitive electro-optic measurement using Jones matrix formulation. Based on our formulation, we present an optimisation of the angle of incidence within the electro-optic probe and its ability to measure electric-fields in a three dimensional Cartesian coordinate system.

Citation Download Citation

Huma Ismail, Ampalavanapillai Nirmalathas, and Efstratios Skafidas "An analysis of electro-optic measurement of electric fields using Jones matrix formulation", Proc. SPIE 8308, Optoelectronic Materials and Devices VI, 83081H (7 December 2011); https://doi.org/10.1117/12.904488

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