Sensor defect probability estimation and yield

Honghong Peng; Brian Keelan

doi:10.1117/12.912142

24 January 2012 Sensor defect probability estimation and yield

Honghong Peng, Brian Keelan

Proceedings Volume 8299, Digital Photography VIII; 829903 (2012) https://doi.org/10.1117/12.912142
Event: IS&T/SPIE Electronic Imaging, 2012, Burlingame, California, United States

Abstract

Sensor yield is directly related to the probability of defective pixel occurrence and the screening criteria. Assuming a spatially independent distribution of single pixel defects, effective on-the-fly correction of singlepixel defects in a color plane, and effective correction of two-pixel defects in a color plane (couplets) through a defect map, sensor yield can be computed based on the occurrence of three adjacent defective pixels in a color plane (triplets). Closed-form equations are derived for calculating the probability of occurrence of couplets and triplets as a function of the probability of a single pixel being defective. If a maximum of one triplet is allowed in a 5-megapixel sensor, to obtain a 98% yield, the probability of a pixel being defective (p) must not exceed 1.3E-3 (6500 defective pixels). For an 8-megapixel sensor, the corresponding requirement would be p < 1.1E-3 (8900 defective pixels). Numerical simulation experiments have confirmed the accuracy of the derived equations.

Citation Download Citation

Honghong Peng and Brian Keelan "Sensor defect probability estimation and yield", Proc. SPIE 8299, Digital Photography VIII, 829903 (24 January 2012); https://doi.org/10.1117/12.912142

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