Fluorescence antibunching microscopy

Osip Schwartz; Jonathan M. Levitt; Dan Oron

doi:10.1117/12.907807

13 February 2012 Fluorescence antibunching microscopy

Osip Schwartz, Jonathan M. Levitt, Dan Oron

Proceedings Volume 8228, Single Molecule Spectroscopy and Superresolution Imaging V; 822802 (2012) https://doi.org/10.1117/12.907807
Event: SPIE BiOS, 2012, San Francisco, California, United States

Abstract

Utilizing quantum properties of light to break the diffraction limit has been the goal of intense research in the recent years. This paper is a progress report on a study aimed at experimentally demonstrating a superresolution microscopy technique enabled by photon antibunching, a non-classical emission statistics feature exhibited by most emitters used as fluorescent markers. We find that photon antibunching gives rise to correlations that encode high spatial frequency information on the distribution of fluorescent emitters. Detecting these correlations using photon counting instrumentation in a standard fluorescence microscope setting allows for three-dimensional superresolution imaging of fluorophore stained samples. The technique provides a quantum alternative to the established superresolution tools.

Citation Download Citation

Osip Schwartz, Jonathan M. Levitt, and Dan Oron "Fluorescence antibunching microscopy", Proc. SPIE 8228, Single Molecule Spectroscopy and Superresolution Imaging V, 822802 (13 February 2012); https://doi.org/10.1117/12.907807

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