A new type of silicon drift detector with curved surface

Lu Cai; Min Yu; Dayu Tian; Jinyan Wang; Yufeng Jin

doi:10.1117/12.900684

8 September 2011 A new type of silicon drift detector with curved surface

Lu Cai, Min Yu, Dayu Tian, Jinyan Wang, Yufeng Jin

Proceedings Volume 8191, International Symposium on Photoelectronic Detection and Imaging 2011: Sensor and Micromachined Optical Device Technologies; 81911E (2011) https://doi.org/10.1117/12.900684
Event: International Symposium on Photoelectronic Detection and Imaging 2011, 2011, Beijing, China

Abstract

A new Silicon Drift Detector (SDD) with curved surface has been proposed and analyzed by simulation. The adjacent drift cathodes punch-through problem in traditional SDD has been eliminated in the novel SDD. The potential distribution and advantages of this new SDD in comparison with the normal one are presented and discussed in this paper.

Citation Download Citation

Lu Cai, Min Yu, Dayu Tian, Jinyan Wang, and Yufeng Jin "A new type of silicon drift detector with curved surface", Proc. SPIE 8191, International Symposium on Photoelectronic Detection and Imaging 2011: Sensor and Micromachined Optical Device Technologies, 81911E (8 September 2011); https://doi.org/10.1117/12.900684

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