Paper
27 September 2011 Mask cycle time reduction for foundry projects
Author Affiliations +
Abstract
One of key deliverables of foundry based manufacturing is low cycletime. Building new and enhancing existing products by mask changes involves significant logistical effort, which could be reduced by standardizing data management and communication procedures among design house, mask shop, and foundry (fab) [1]. As an example, a typical process of taping out can take up to two weeks in addition to technical effort, for database handling, mask form completion, management approval, PO signoff and JDV review, translating into loss of revenue. In order to reduce this delay, we are proposing to develop a unified online system which should assist with the following functions: database edits, final verifications, document approvals, mask order entries, and JDV review with engineering signoff as required. This would help a growing number of semiconductor products to be flexibly manufactured at different manufacturing sites. We discuss how the data architecture based on a non-relational database management system (NRDMBS) extracted into a relational one (RDMBS) should provide quality information [2], to reduce cycle time significantly beyond 70% for an example 2 week tapeout schedule.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. Balasinski "Mask cycle time reduction for foundry projects", Proc. SPIE 8166, Photomask Technology 2011, 81660K (27 September 2011); https://doi.org/10.1117/12.896736
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Databases

Photomasks

Manufacturing

Computer aided design

Data modeling

Data communications

Data storage

RELATED CONTENT

DfM requirements and ROI analysis for system-on-chip
Proceedings of SPIE (November 04 2005)
DFM: magic bullet or marketing hype?
Proceedings of SPIE (May 03 2004)
The guideline of reticle data management (Ver. 2)
Proceedings of SPIE (June 02 2004)
Predicting mask yields through the use of a yield model
Proceedings of SPIE (December 07 1994)

Back to Top