Design and fabrication of single- and coupled-cavity thin film structures for optical switching and regeneration

Liyong Diao

doi:10.1117/12.893985

7 September 2011 Design and fabrication of single- and coupled-cavity thin film structures for optical switching and regeneration

Liyong Diao

Author Affiliations +

Proceedings Volume 8120, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications V; 812007 (2011) https://doi.org/10.1117/12.893985
Event: SPIE Photonic Devices + Applications, 2011, San Diego, California, United States

Abstract

All-optical switching and regeneration based on optical Kerr effect are feasible in single and coupled-cavity thin film structures comprised of high-index and low-index materials. In this report we will present a simulated Kerr effect nonlinear function switching from low to high transmissions at telecom wavelength using an optimized coupled cavity structure. This nonlinear transfer function has multiple high transmission peaks suitable for all-optical switching and regeneration detection at high transmission state. Successful fabrication of single and coupled-cavity dielectric thin film structures for 800 nm were achieved with low refractive index (n=1.46) SiO₂ and high refractive index (n=1.90) SiN by RF PVD. The simulated transmissions of the samples match almost exactly with the measured transmissions by VASE ellipsometer. The strategy of precision control of central wavelength of the resonant structure was implemented and good results were attained. The RMS surface roughness of RF sputtered and pulsed DC sputtered thin films are investigated by AFM. Suitability of nonlinear materials for ultrafast optical Kerr effect nonlinear refractions will be briefly discussed.

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Liyong Diao "Design and fabrication of single- and coupled-cavity thin film structures for optical switching and regeneration", Proc. SPIE 8120, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications V, 812007 (7 September 2011); https://doi.org/10.1117/12.893985

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KEYWORDS

Refractive index

Thin films

Nonlinear optics

Switching

Kerr effect

Silica

Refraction

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