Optoelectronic phase noise system designed for microwaves photonics sources measurements in metrology application

Patrice Salzenstein; Nathalie Cholley; Mikhail Zarubin; Ekaterina Pavlyuchenko; Abdelhamid Hmima; Yanne K. Chembo; Laurent Larger

doi:10.1117/12.886694

18 May 2011 Optoelectronic phase noise system designed for microwaves photonics sources measurements in metrology application

Patrice Salzenstein, Nathalie Cholley, Mikhail Zarubin, Ekaterina Pavlyuchenko, Abdelhamid Hmima, Yanne K. Chembo, Laurent Larger

Author Affiliations +

Proceedings Volume 8071, Nonlinear Optics and Applications V; 807111 (2011) https://doi.org/10.1117/12.886694
Event: SPIE Optics + Optoelectronics, 2011, Prague, Czech Republic

Abstract

The performance advances in communication systems like Radar system, precision navigation, space application and time and frequency metrology require more stable frequency and low phase noise system. Here is presented a configuration of phase noise measurement system operating in X- band using a photonic delay line as a frequency discriminator. This system doesn't need any excellent frequency reference and works for any frequency between 8.2 and 12.4 GHz. Using cross correlation on 500 averages, noise floor of the instrument is respectively -150 and -170 dBc/Hz at 10¹ and 10⁴ Hz from the 10 GHz carrier (-90 and -170 dBc/Hz including 2 km delay lines). This instrument is developed in the context of association with the national french metrology institute (laboratoire national de métrologie et d'essais, LNE). This calibration system is to be integrated in measurements means of the accredited laboratory to improve the Calibration Metrology Capabilities (CMC) of the LNE.

Citation Download Citation

Patrice Salzenstein, Nathalie Cholley, Mikhail Zarubin, Ekaterina Pavlyuchenko, Abdelhamid Hmima, Yanne K. Chembo, and Laurent Larger "Optoelectronic phase noise system designed for microwaves photonics sources measurements in metrology application", Proc. SPIE 8071, Nonlinear Optics and Applications V, 807111 (18 May 2011); https://doi.org/10.1117/12.886694

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available