Paper
28 February 2011 Inverting scattered fields for sub-wavelength resolution using negative index metamaterials
Y. Zhang, M. A. Fiddy
Author Affiliations +
Abstract
Sub-wavelength resolution using a negative index metamaterial appears to be severely limited in practice, particularly due to material losses. We present some numerical studies on what high spatial frequency information about a thin and a thick object can be obtained, assuming multiple scattering and coupling between evanescent and propagating waves. Weak scattering approximations cannot be assumed as scattering features reduce in size and become subwavelength in nature making an inverse scattering approach necessary in order to relate the measured superresolved field to object index or permittivity fluctuations. We discuss the relationship between the field in the object and image domains and discuss possible procedures for recovering subwavelength index fluctuations from measured data.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Y. Zhang and M. A. Fiddy "Inverting scattered fields for sub-wavelength resolution using negative index metamaterials", Proc. SPIE 7946, Photonic and Phononic Properties of Engineered Nanostructures, 79460V (28 February 2011); https://doi.org/10.1117/12.873986
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Metamaterials

Scattering

Image resolution

Image restoration

Image processing

Spatial frequencies

Photomasks

RELATED CONTENT


Back to Top