Characterization Of Optical And Transport Properties Of Semiconductors: A Photothermal Approach

Nabil M. Amer

doi:10.1117/12.940885

22 April 1987 Characterization Of Optical And Transport Properties Of Semiconductors: A Photothermal Approach

Nabil M. Amer

Proceedings Volume 0794, Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices; (1987) https://doi.org/10.1117/12.940885
Event: Advances in Semiconductors and Semiconductor Structures, 1987, Bay Point, FL, United States

Abstract

Photothermal spectroscopy employs the small rise in temperature associated with the absorption of electromagnetic radiation to probe optical and transport properties of materials. A review of the various photothermal detection schemes is given, and examples which illustrate the power of this technique are reviewed.

Citation Download Citation

Nabil M. Amer "Characterization Of Optical And Transport Properties Of Semiconductors: A Photothermal Approach", Proc. SPIE 0794, Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices, (22 April 1987); https://doi.org/10.1117/12.940885

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