Paper
2 March 2011 Cathodoluminescence characteristics of linearly shaped staggered InGaN quantum wells light-emitting diodes
Hongping Zhao, Jing Zhang, Guangyu Liu, Takahiro Toma, Jonathan D. Poplawsky, Volkmar Dierolf, Nelson Tansu
Author Affiliations +
Proceedings Volume 7939, Gallium Nitride Materials and Devices VI; 793905 (2011) https://doi.org/10.1117/12.875002
Event: SPIE OPTO, 2011, San Francisco, California, United States
Abstract
Metalorganic chemical vapor deposition (MOCVD) growths of linearly-shaped staggered InGaN quantum wells lightemitting diodes are performed. The use of linearly-shaped staggered InGaN QWs leads to the shift of both electron and hole wavefunction toward the center of the quantum well region with enhanced momentum matrix element, which results in the enhancement of the spontaneous radiaitve recombination rate. The power-density-dependent cathodoluminescence measurements for both conventional and linearly-shaped staggered InGaN QW show 2.5-3.5 times increase in the integrated cathodoluminescence intensity by using the novel active region.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hongping Zhao, Jing Zhang, Guangyu Liu, Takahiro Toma, Jonathan D. Poplawsky, Volkmar Dierolf, and Nelson Tansu "Cathodoluminescence characteristics of linearly shaped staggered InGaN quantum wells light-emitting diodes", Proc. SPIE 7939, Gallium Nitride Materials and Devices VI, 793905 (2 March 2011); https://doi.org/10.1117/12.875002
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Quantum wells

Indium gallium nitride

Light emitting diodes

Metalorganic chemical vapor deposition

Gallium nitride

Chemical elements

Electron beams

Back to Top