Effect of structural parameters on the performance of fiber distance sensor with single mode illumination and inclined-fiber receiving

Zhi Zhong; Huan Peng; Mingguang Shan; Lili Guo

doi:10.1117/12.870099

11 November 2010 Effect of structural parameters on the performance of fiber distance sensor with single mode illumination and inclined-fiber receiving

Zhi Zhong, Huan Peng, Mingguang Shan, Lili Guo

Author Affiliations +

Proceedings Volume 7855, Optical Metrology and Inspection for Industrial Applications; 785512 (2010) https://doi.org/10.1117/12.870099
Event: Photonics Asia 2010, 2010, Beijing, China

Abstract

In order to study the effect of structural parameters on the performance of fiber distance sensor with one normal single mode fiber for illuminating and one inclined multimode fiber for receiving, a theoretical power-distance model is established to describe the influence of the inclination fiber angle, the separation distance between the two fiber tips, the offset distance between the two fiber tips and/or reflector angle on the modulation performance of the fiber distance sensor. Numerical simulation results indicate that for the sensitivity of the sensor, it increases as the inclination fiber angle increases, the separation distance decreases, the offset distance decreases and/or the reflector angle increases. For the linear region, it increases as the separation distance increases, and/or the reflector angle decreases, however, it change less obviously as the inclination fiber angle increases, and even remains unchanged as the offset distance is changeable. For the dead zone, it decreases as the separation distance decreases, and/or the offset distance increases, and the study would help the design of the inclined-fiber receiving distance sensor to the desired modulation performance.

Citation Download Citation

Zhi Zhong, Huan Peng, Mingguang Shan, and Lili Guo "Effect of structural parameters on the performance of fiber distance sensor with single mode illumination and inclined-fiber receiving", Proc. SPIE 7855, Optical Metrology and Inspection for Industrial Applications, 785512 (11 November 2010); https://doi.org/10.1117/12.870099

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