Paper
3 December 2010 Preliminary ellipsometric studies and tests for measuring the birefringence of electro-optic materials
Petre C. Logofatu, Cristian Udrea, Valentin Ion, Nicu Doinel Scărişoreanu, Raluca Műller
Author Affiliations +
Proceedings Volume 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V; 782114 (2010) https://doi.org/10.1117/12.882140
Event: Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies, 2010, Constanta, Romania
Abstract
Ellipsometry is a convenient means to ascertain electro-optic properties, and the null-type methods are particularly so because they do not require a powermeter. Electro-optic materials like Strontium Barium Niobate (SBN) with the symmetry axis normal or parallel to the surface are materials suitable for thin film integrated optic devices, therefore of practical interest. For this reason we endeavoured to devise and to test experimental arrangements that measure the birefringence of uniaxial structures with the symmetry axis parallel and perpendicular to the surface.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Petre C. Logofatu, Cristian Udrea, Valentin Ion, Nicu Doinel Scărişoreanu, and Raluca Műller "Preliminary ellipsometric studies and tests for measuring the birefringence of electro-optic materials", Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 782114 (3 December 2010); https://doi.org/10.1117/12.882140
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KEYWORDS
Electro optics

Birefringence

Thin films

Polarizers

Polarization

Ellipsometry

Phase compensation

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