Improved panchromatic sharpening

Jonghwa Lee; Sangwook Lee; Chulhee Lee

doi:10.1117/12.862243

24 August 2010 Improved panchromatic sharpening

Jonghwa Lee, Sangwook Lee, Chulhee Lee

Proceedings Volume 7810, Satellite Data Compression, Communications, and Processing VI; 78100T (2010) https://doi.org/10.1117/12.862243
Event: SPIE Optical Engineering + Applications, 2010, San Diego, California, United States

Abstract

In this paper, we present a new panchromatic sharpening method based on quality parameter optimization. Traditionally, quality metrics such as UIQI, CORR, and ERGAS have been used to assess the quality of panchromatic sharpening. Generally, HPF (high pass filtering) based panchromatic sharpening methods produce good performance. However, one problem with these methods is the peak noise that arises due to a small denominator value when the mean shift problem is addressed. In order to address this problem, we introduce an offset value that was optimized based on a quality metric. We assumed that the offset value was invariant with respect to the spatial scale, and it was used to enhance the resolution of the original multispectral images by using a high-resolution panchromatic image. The experimental results demonstrate that the proposed method showed better performance than some existing panchromatic sharpening methods.

Citation Download Citation

Jonghwa Lee, Sangwook Lee, and Chulhee Lee "Improved panchromatic sharpening", Proc. SPIE 7810, Satellite Data Compression, Communications, and Processing VI, 78100T (24 August 2010); https://doi.org/10.1117/12.862243

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KEYWORDS

Image resolution

Earth observing sensors

High resolution satellite images

Linear filtering

Discrete wavelet transforms

Image processing

Modulation transfer functions

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