High-resolution x-ray phase tomography

Andrew G. Peele; C. David L. Thomas; John G. Clement; Benedicta D. Arhatari; Kevin M. Hannah; Chandni Doshi; Corey T. Putkunz; Jesse N. Clark

doi:10.1117/12.862177

2 September 2010 High-resolution x-ray phase tomography

Andrew G. Peele, C. David L. Thomas, John G. Clement, Benedicta D. Arhatari, Kevin M. Hannah, Chandni Doshi, Corey T. Putkunz, Jesse N. Clark

Author Affiliations +

Proceedings Volume 7804, Developments in X-Ray Tomography VII; 780403 (2010) https://doi.org/10.1117/12.862177
Event: SPIE Optical Engineering + Applications, 2010, San Diego, California, United States

Abstract

X-ray tomography is a workhorse tool of non-destructive imaging. It is used to probe three-dimensional structures across a wide range of length scales for objects that offer good absorption contrast to x-rays. In recent years extremely high resolution imaging (on the order of tens of nanometres) has become possible due to technological advances in x-ray optics. At the same time the requirement for strong absorption contrast has been relaxed thanks to the advent of new experimental and algorithmic techniques in phase imaging. Advances in both resolution and phase imaging can be combined to image biological samples at the sub-cellular level. I will report on recent advances in our work including improvements to the current approaches in extracting phase information at high resolution from measurements of the diffracted intensity from a sample. I will also discuss our current experimental status.

Citation Download Citation

Andrew G. Peele, C. David L. Thomas, John G. Clement, Benedicta D. Arhatari, Kevin M. Hannah, Chandni Doshi, Corey T. Putkunz, and Jesse N. Clark "High-resolution x-ray phase tomography", Proc. SPIE 7804, Developments in X-Ray Tomography VII, 780403 (2 September 2010); https://doi.org/10.1117/12.862177

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