Thermoreflectance and multimode imaging for defect location in silicon solar cells

Lawrence Domash; Kevin McCarthy; Qiaoer Zhou; Kadhair Al-Hemyari; Xiaolin Hu; Janice Hudgings

doi:10.1117/12.863783

19 August 2010 Thermoreflectance and multimode imaging for defect location in silicon solar cells

Lawrence Domash, Kevin McCarthy, Qiaoer Zhou, Kadhair Al-Hemyari, Xiaolin Hu, Janice Hudgings

Proceedings Volume 7773, Reliability of Photovoltaic Cells, Modules, Components, and Systems III; 77730A (2010) https://doi.org/10.1117/12.863783
Event: SPIE Solar Energy + Technology, 2010, San Diego, California, United States

Abstract

Silicon solar cells suffer from defects such as microcracks and shunts that limit performance and reliability. We describe a new family of imaging techniques, including lock-in thermoreflectance and mechanoreflectance, which offer much higher spatial resolution and lower cost than current methods for inspection of solar cells. These techniques are based on advanced image processing algorithms for detection of very small variations in optical reflectance, using ordinary visible light CCD cameras. The image data can be merged with conventional techniques such as electroluminescence, in one camera system. Experimental results and comparison with conventional techniques for evaluation of solar cells are presented.

Citation Download Citation

Lawrence Domash, Kevin McCarthy, Qiaoer Zhou, Kadhair Al-Hemyari, Xiaolin Hu, and Janice Hudgings "Thermoreflectance and multimode imaging for defect location in silicon solar cells", Proc. SPIE 7773, Reliability of Photovoltaic Cells, Modules, Components, and Systems III, 77730A (19 August 2010); https://doi.org/10.1117/12.863783

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