Paper
14 May 2010 A micro-SPM head array for large-scale topography measurement
S. Gao, Z. Li, K. Herrmann
Author Affiliations +
Abstract
Rapid advances in nano-positioning/motion technology have offered metrologists in the field of precision engineering larger and larger potential measurement range. A concept of micro-SPM head array is proposed in this paper to enhance the performance of the currently available nano-measuring machines and effectively reduce the measurement time for large specimen. The proposed micro-SPM head array consists of 1 × N ( N = 7 in our case) micro-SPM heads/units, which are realized in one chip by MEMS technique. The kern of each SPM head is an electrostatic comb-drive actuator, whose main shaft protrudes out of the MEMS chip to sense the surface topography of a specimen under test. To further improve the lateral resolution of the micro-SPM head, an AFM tip can then be mounted onto the end of the actuator's main shaft. To ensure the traceability of the measurement results from micro-SPM head, a fiber-based interferometer array is considered to be integrated within the micro-SPM head array so as to in-situ calibrate the in-plane displacement sensing system of the micro-SPM head. Design and simulation of the mico-SPM head array together with the corresponding micro-interferometer will be detailed in this manuscript.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
S. Gao, Z. Li, and K. Herrmann "A micro-SPM head array for large-scale topography measurement", Proc. SPIE 7718, Optical Micro- and Nanometrology III, 77181L (14 May 2010); https://doi.org/10.1117/12.854397
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CITATIONS
Cited by 2 scholarly publications and 2 patents.
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KEYWORDS
Head

Scanning probe microscopy

Actuators

Microelectromechanical systems

Metrology

Atomic force microscopy

Interferometers

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