Characterization of material reflectance variation through measurement and simulation

John Kerekes; Caitlin Hart; Michael Gartley; Brent Bartlett; C. Eric Nance

doi:10.1117/12.852211

12 May 2010 Characterization of material reflectance variation through measurement and simulation

John Kerekes, Caitlin Hart, Michael Gartley, Brent Bartlett, C. Eric Nance

Proceedings Volume 7695, Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XVI; 76950P (2010) https://doi.org/10.1117/12.852211
Event: SPIE Defense, Security, and Sensing, 2010, Orlando, Florida, United States

Abstract

The characterization of material reflectance properties is important in the analysis of hyperspectral and polarization imagery as well as accurate simulation of such images. This paper merges the results of empirical reflectance property (spectral pBRDF) measurements with detailed model based simulations. The empirical data are collected with a laboratory spectroradiometer as well as an RIT-developed spectro-polarimetric imaging goniometer. The modeling uses an adaptation of RIT's Digital Imaging and Remote Sensing Image Generation (DIRSIG) model to capture the radiative transfer in rough surfaces with micron-scale features. Measurements and model results for several man-made materials under various conditions are presented.

Citation Download Citation

John Kerekes, Caitlin Hart, Michael Gartley, Brent Bartlett, and C. Eric Nance "Characterization of material reflectance variation through measurement and simulation", Proc. SPIE 7695, Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XVI, 76950P (12 May 2010); https://doi.org/10.1117/12.852211

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