Reliability studies of high operating temperature MCT photoconductor detectors

Wei Wang; Jintong Xu; Yan Zhang; Xiangyang Li

doi:10.1117/12.865502

22 October 2010 Reliability studies of high operating temperature MCT photoconductor detectors

Wei Wang, Jintong Xu, Yan Zhang, Xiangyang Li

Proceedings Volume 7658, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology; 765849 (2010) https://doi.org/10.1117/12.865502
Event: 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies, 2010, Dalian, China

Abstract

This paper concerns HgCdTe (MCT) infrared photoconductor detectors with high operating temperature. The near room temperature operation of detectors have advantages of light weight, less cost and convenient usage. Their performances are modest and they suffer from reliable problems. These detectors face with stability of the package, chip bonding area and passivation layers. It's important to evaluate and improve the reliability of such detectors. Defective detectors were studied with SEM(Scanning electron microscope) and microscopy. Statistically significant differences were observed between the influence of operating temperature and the influence of humidity. It was also found that humility has statistically significant influence upon the stability of the chip bonding and passivation layers, and the amount of humility isn't strongly correlated to the damage on the surface. Considering about the commonly found failures modes in detectors, special test structures were designed to improve the reliability of detectors. An accelerated life test was also implemented to estimate the lifetime of the high operating temperature MCT photoconductor detectors.

Citation Download Citation

Wei Wang, Jintong Xu, Yan Zhang, and Xiangyang Li "Reliability studies of high operating temperature MCT photoconductor detectors", Proc. SPIE 7658, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology, 765849 (22 October 2010); https://doi.org/10.1117/12.865502

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KEYWORDS

Sensors

Infrared sensors

Reliability

Infrared detectors

Accelerated life testing

Photoresistors

Infrared radiation

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