Electronic noise comparison of amorphous silicon current mode and voltage mode active pixel sensors for large area digital x-ray imaging

Dali Wu; Nader Safavian; Mohammad Y. Yazdandoost; Mohammad Hadi Izadi; Karim S. Karim

doi:10.1117/12.845561

22 March 2010 Electronic noise comparison of amorphous silicon current mode and voltage mode active pixel sensors for large area digital x-ray imaging

Dali Wu, Nader Safavian, Mohammad Y. Yazdandoost, Mohammad Hadi Izadi, Karim S. Karim

Author Affiliations +

Proceedings Volume 7622, Medical Imaging 2010: Physics of Medical Imaging; 76223Q (2010) https://doi.org/10.1117/12.845561
Event: SPIE Medical Imaging, 2010, San Diego, California, United States

Abstract

A detailed experimental and theoretical investigation of noise in both current mode and voltage mode amorphous silicon (a-Si) active pixel sensors (APS) has been performed. Both flicker (1/f) and thermal are considered in this study. The experimental result in this paper emphasizes the computation of the output noise variance. The theoretical analysis shows that the voltage mode APS has an advantage over the current mode APS in terms of the flicker noise due to the operation of the readout process. The experimental data are compared to the theoretical analysis and are in good agreement.

Citation Download Citation

Dali Wu, Nader Safavian, Mohammad Y. Yazdandoost, Mohammad Hadi Izadi, and Karim S. Karim "Electronic noise comparison of amorphous silicon current mode and voltage mode active pixel sensors for large area digital x-ray imaging", Proc. SPIE 7622, Medical Imaging 2010: Physics of Medical Imaging, 76223Q (22 March 2010); https://doi.org/10.1117/12.845561

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