Confocal microscope with enhanced lateral resolution using engineered illumination pupil

B. R. Boruah

doi:10.1117/12.841120

24 February 2010 Confocal microscope with enhanced lateral resolution using engineered illumination pupil

B. R. Boruah

Proceedings Volume 7570, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVII; 75700N (2010) https://doi.org/10.1117/12.841120
Event: SPIE BiOS, 2010, San Francisco, California, United States

Abstract

The maximum lateral resolution achievable with a confocal microscope is twice that of a wide field microscope. However, the spatial frequency content in the confocal image near the cutoff has very poor signal and is hardly of any practical use. Barring in the fluorescence mode, no technique can provide significant resolution enhancement simultaneously both in the reflection and fluorescence mode of the confocal microscope. This paper describes a technique based on aperture engineering that can significantly enhance the high spatial frequency content in the image of a confocal microscope, in principle, working either in the reflection or the fluorescence mode. Results obtained from numerical simulations and experimental implementation are presented.

Citation Download Citation

B. R. Boruah "Confocal microscope with enhanced lateral resolution using engineered illumination pupil", Proc. SPIE 7570, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVII, 75700N (24 February 2010); https://doi.org/10.1117/12.841120

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KEYWORDS

Confocal microscopy

Microscopes

Point spread functions

Resolution enhancement technologies

Illumination engineering

Luminescence

Spatial frequencies

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