Paper
28 December 2010 Parameter identification of double parallel joints coordinate measuring machine
Teng Ye, Junrui Li, Wentao Cheng, Liandong Yu, Yetai Fei
Author Affiliations +
Proceedings Volume 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation; 75445W (2010) https://doi.org/10.1117/12.885390
Event: Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 2010, Hangzhou, China
Abstract
Double Parallel Joints coordinate measuring machine (CMM) is a new type coordinate measuring device with 9 structural parameters with accuracy difficult to be ensured just by processing and assembly. Calibration is needed to identify the structural parameters of the measuring machine. This article describes the calibration process of such a Double Parallel Joints CMM, and simulation was employed to analyze how the number of samples and angle measurement accuracy influence the measurement precision and calibration result during calibrating process. The conclusions are very instructive to precision design or error allocation and calibration process of the Double Parallel Joints CMM.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Teng Ye, Junrui Li, Wentao Cheng, Liandong Yu, and Yetai Fei "Parameter identification of double parallel joints coordinate measuring machine", Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75445W (28 December 2010); https://doi.org/10.1117/12.885390
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KEYWORDS
Calibration

Sensors

Microelectromechanical systems

Kinematics

Error analysis

Robotics

Statistical analysis

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