Study on correcting the temperature measurement of infrared thermography by determining the atmospheric transmittance

Juan Wu; Jian Sun; Le Chen

doi:10.1117/12.885340

31 December 2010 Study on correcting the temperature measurement of infrared thermography by determining the atmospheric transmittance

Juan Wu, Jian Sun, Le Chen

Author Affiliations +

Proceedings Volume 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation; 75445D (2010) https://doi.org/10.1117/12.885340
Event: Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 2010, Hangzhou, China

Abstract

The factors that effect the surface temperature measurement of planes using infrared thermography were analyzed based on the theory of infrared radiation. The blackbody is normally used as a measurement standard to calibrate the infrared thermography. Because the atmosphere has an affect of absorption on the infrared ray, while all the measurement as well as blackbody can not avoid transmitting through the atmosphere, so that the affect brought by the atmospheric transmittance becomes a main factor that effects the measurement on blackbody. And the influence caused by the atmospheric transmittance was mainly discussed. Meanwhile, a set of experimental taking blackbody as measured target has been done to discover the principle of error during the measurement. And the atmospheric transmittance can be calculated through the experiment results. Furthermore, the calculated value was used to compensate the error caused by the atmosphere. Compare the calibrated results with before, the measurement errors significantly reduced. Then the accuracy of measurement has been improved. Finally, a way of setting blackbody as a measurement standard was proposed to compensate the error brought by atmosphere.

Citation Download Citation

Juan Wu, Jian Sun, and Le Chen "Study on correcting the temperature measurement of infrared thermography by determining the atmospheric transmittance", Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75445D (31 December 2010); https://doi.org/10.1117/12.885340

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available