Testing error analysis of accelerometer error model coefficients on indexing table

Shunqing Ren; Ye Wang; Yuan Cheng; Shijia Chen

doi:10.1117/12.885205

31 December 2010 Testing error analysis of accelerometer error model coefficients on indexing table

Shunqing Ren, Ye Wang, Yuan Cheng, Shijia Chen

Proceedings Volume 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation; 75445B (2010) https://doi.org/10.1117/12.885205
Event: Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 2010, Hangzhou, China

Abstract

In order to identify accelerometer error model coefficients more accurately on indexing table, the relationship between the calibration accuracy of accelerometer and the errors of indexing table is determined. At first, the attitude matrix between accelerometer coordinate system and geographical coordinate system is established based on consideration of various error sources. Then the accelerometer output expressions are analyzed based on the established error model. After that, according to the output of an accelerometer, the relationship among calibration errors of accelerometer model coefficients, indexing table errors and alignment errors is analyzed through Fourier analysis. Finally, an accelerometer is calibrated on indexing table and the angular errors are measured, modifications of bias K_F and scale factor K_I are analyzed before and after compensating for the angular errors. Experiments show that, to make relative calibration accuracys of K_F/K_I and ▵K_I/K_I achieve relative accuracy of 10^-6, the first and the second order term of Fourier series of the angular errors of the indexing table should be less than 0.15" and 0.4" separately, random error and angular rotary error of the axis system should be limited to 1" level.

Citation Download Citation

Shunqing Ren, Ye Wang, Yuan Cheng, and Shijia Chen "Testing error analysis of accelerometer error model coefficients on indexing table", Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75445B (31 December 2010); https://doi.org/10.1117/12.885205

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