Paper
31 December 2010 Sub-pixel location of center of target based on Zernike moment
Bo Liang, Mingli Dong, Jun Wang, Bixi Yan
Author Affiliations +
Proceedings Volume 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation; 75443A (2010) https://doi.org/10.1117/12.885811
Event: Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 2010, Hangzhou, China
Abstract
To achieve high location accuracy, a sub-pixel location method based on Zernike moment is proposed for the location of the center of target. Original images are preprocessed to weaken the effect of noise. Sub-pixel edge detection is implemented using Zernike moment. The center of target is located using an ellipse fitting algorithm. Some criterions such as grayscale, area and circular degree of the objects are used to recognize the target simultaneously. Experiments are carried out with synthetic image and real image to verify the accuracy and noise immunity of the proposed method. Experimental results show that the accuracy is better than 1/25 pixel. It can therefore be concluded that the method can be used to meet the requirement of high-accuracy measurement.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bo Liang, Mingli Dong, Jun Wang, and Bixi Yan "Sub-pixel location of center of target based on Zernike moment", Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75443A (31 December 2010); https://doi.org/10.1117/12.885811
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Cited by 6 scholarly publications.
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KEYWORDS
Edge detection

Signal to noise ratio

Detection and tracking algorithms

Target recognition

Information technology

3D metrology

Hough transforms

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