Paper
31 December 2010 Image restoration for a rectangular poor-pixels detector
Pengcheng Wen, Xiangjun Wang, Hong Wei
Author Affiliations +
Proceedings Volume 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation; 754436 (2010) https://doi.org/10.1117/12.885301
Event: Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 2010, Hangzhou, China
Abstract
This paper presents a unique two-stage image restoration framework especially for further application of a novel rectangular poor-pixels detector, which, with properties of miniature size, light weight and low power consumption, has great value in the micro vision system. To meet the demand of fast processing, only a few measured images shifted up to subpixel level are needed to join the fusion operation, fewer than those required in traditional approaches. By maximum likelihood estimation with a least squares method, a preliminary restored image is linearly interpolated. After noise removal via Canny operator based level set evolution, the final high-quality restored image is achieved. Experimental results demonstrate effectiveness of the proposed framework. It is a sensible step towards subsequent image understanding and object identification.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Pengcheng Wen, Xiangjun Wang, and Hong Wei "Image restoration for a rectangular poor-pixels detector", Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 754436 (31 December 2010); https://doi.org/10.1117/12.885301
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KEYWORDS
Image restoration

Sensors

Image fusion

Image processing

Image understanding

Signal processing

Computing systems

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