Paper
31 December 2009 Photoluminescence and photothermal deflection measurements in KDP crystals for high power applications
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Abstract
KDP is a non linear optical crystal used for frequency conversion in high power applications. In this paper we present results of optical non-destructive measurements on different fast growth KDP crystals in order to characterize the precursors responsible for laser-induced damage. We performed two types of analysis: the first one is temporally resolved photoluminescence excited by a pulsed Nd:YAG laser at 4.66 eV and 3.49 eV (266 nm and 355 nm). The second is spatially resolved photothermal deflection pumped by a CW Argon laser at 3.53 eV (351 nm). With these two complementary techniques we highlight the presence of large scale inhomogeneities and we discriminate nano-scale defects statistically distributed in the bulk of the crystals.
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Alessandra Ciapponi, Frank Wagner, Jean-Yves Natoli, Bertrand Bertussi, and François Guillet "Photoluminescence and photothermal deflection measurements in KDP crystals for high power applications", Proc. SPIE 7504, Laser-Induced Damage in Optical Materials: 2009, 750417 (31 December 2009); https://doi.org/10.1117/12.836235
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KEYWORDS
Crystals

Luminescence

Absorption

Laser induced damage

Ultraviolet radiation

Crystal optics

3D metrology

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