Statistical analysis of measurement processes for time-of-flight cameras

Faisal Mufti; Robert Mahony

doi:10.1117/12.824643

4 September 2009 Statistical analysis of measurement processes for time-of-flight cameras

Faisal Mufti, Robert Mahony

Proceedings Volume 7447, Videometrics, Range Imaging, and Applications X; 74470I (2009) https://doi.org/10.1117/12.824643
Event: SPIE Optical Engineering + Applications, 2009, San Diego, California, United States

Abstract

In recent years, the demand for 3D vision systems has increased in fields such as detection and recognition, motion modelling, 3D environment reconstruction and tracking. This has motivated the development of range image technology, especially Time-of-Flight (TOF) cameras, that provide direct measurement of distance between the camera and the targeted surface. These devices have an advantage over traditional range data sensors due to their capability to provide frame rate range data over a full image array. The quality of the measurement of these sensors depends heavily on signal-to-noise (SNR) of the incoming signal and the subsequent processing algorithms. In phase shift TOF cameras, phase shift sampling is used to measure amplitude, phase and the offset (intensity) of the received signal. Each of these measurements has an associated statistical distribution that affects the SNR of the TOF signal, limiting the reliability of 3D range data. It is crucial to understand the statistical distributions of these three parameters for accurate distance measurement analysis especially in low SNR scenarios. In this paper, we provide explicit noise models for the three parameters of amplitude, phase and intensity. We use this analysis to provide an improved estimation of error in range measurement.

Citation Download Citation

Faisal Mufti and Robert Mahony "Statistical analysis of measurement processes for time-of-flight cameras", Proc. SPIE 7447, Videometrics, Range Imaging, and Applications X, 74470I (4 September 2009); https://doi.org/10.1117/12.824643

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available