Paper
4 August 2009 Preparation and characterization of polycrystalline iodized mercury thick films for detector array
Junyang Yu, Weimin Shi, Dongmei Li, Juan Qin, Linjun Wang, Weifeng Zheng, Tingting Xiong, Yiben Xia
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Abstract
The polycrystalline mercuric iodide thick-film array was deposited by hot wall physical vapor deposition (HWPVD) method using an aluminum alloy mask. The pixel size of the 4×4 array is 5×5 mm2, and pixel spacing is about 0.2mm. Comparative study of the quality of the films grown on different pixels (type A, B, C) was conducted by Atomic force microscopy (AFM), Scanning electron microscopy (SEM), X-ray diffraction (XRD), and Raman spectroscopy. The results showed that films of all types were all compactly formed by separated columnar monocrystallines with uniform orientation along c-direction and had similar crystalline structures, indicating that the thick films deposited on the substrate had a good uniformity as a whole, and of all the three different type samples, type A were of the relatively highest quality.
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Junyang Yu, Weimin Shi, Dongmei Li, Juan Qin, Linjun Wang, Weifeng Zheng, Tingting Xiong, and Yiben Xia "Preparation and characterization of polycrystalline iodized mercury thick films for detector array", Proc. SPIE 7385, International Symposium on Photoelectronic Detection and Imaging 2009: Terahertz and High Energy Radiation Detection Technologies and Applications, 73851S (4 August 2009); https://doi.org/10.1117/12.836663
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KEYWORDS
Crystals

Scanning electron microscopy

Aluminum

Raman spectroscopy

Atomic force microscopy

Detector arrays

Mercury

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