A defect detection scheme for high-end CMOS image sensor

Li Liu

doi:10.1117/12.834296

6 August 2009 A defect detection scheme for hi-end CMOS image sensor

Li Liu

Proceedings Volume 7384, International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Imaging Detectors and Applications; 73840B (2009) https://doi.org/10.1117/12.834296
Event: International Symposium on Photoelectronic Detection and Imaging 2009, 2009, Beijing, China

Abstract

Defect Detection is a critical process for image sensor production. Many systems has been designed for low-end CMOS sensors in applications such as mobile phone or webcam. While the industry is stepping into the hi-end application filed such as motion picture, higher performance sensors are produced with the improvement of technologies which have different quality standard with those low-end counterparts. In this paper, a new blemish detection scheme for hi-end CMOS image sensor is proposed. The defective pixels, columns/rows and clusters on sensors are detected using different image processing algorithms. The criteria and methods are adjusted according to the different regions of the image sensor.The tested sensors are then classified according to the test results. The detection data are also stored for the future video processing purpose. The efficiency of the scheme is proven by experiments conducted on a high speed high resolution CMOS sensor.

Citation Download Citation

Li Liu "A defect detection scheme for hi-end CMOS image sensor", Proc. SPIE 7384, International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Imaging Detectors and Applications, 73840B (6 August 2009); https://doi.org/10.1117/12.834296

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