Novel system for automatic measuring diopter based on ARM circuit block

Feng Xue; Lei Zhong; Zhe Chen; Deng-pan Xue; Xiang-ning Li

doi:10.1117/12.836003

24 August 2009 Novel system for automatic measuring diopter based on ARM circuit block

Feng Xue, Lei Zhong, Zhe Chen, Deng-pan Xue, Xiang-ning Li

Proceedings Volume 7381, International Symposium on Photoelectronic Detection and Imaging 2009: Material and Device Technology for Sensors; 73812E (2009) https://doi.org/10.1117/12.836003
Event: International Symposium on Photoelectronic Detection and Imaging 2009, 2009, Beijing, China

Abstract

Traditional commercial instruments utilized in vision screening programs cannot satisfy the request for real-time diopter measurement by far, and their success is limited by some defectiveness such as computer-attached, clumsy volume, and low accuracy of parameters measured, etc. In addition, astigmatic eyes cannot be determined in many devices. This paper proposes a new design of diopter measurement system based on SAMSUNG's ARM9 circuit block. There are several contributions in the design. The new developed system has not only the function of automatically measuring diopter, but also the advantages of the low cost, and especially the simplicity and portability. Besides, by placing point sources in three directions, the instrument can determine astigmatic eyes at the same time. Most of the details are introduced as the integrated design of measuring system, interface circuit of embedded system and so on. Through a preliminary experiment, it is proved that the system keeps good feasibility and validity. The maximum deviation of measurement result is 0.344D.The experimental results also demonstrate the system can provide the service needed for real-time applications. The instrument present here is expected to be widely applied in many fields such as the clinic and home healthcare.

Citation Download Citation

Feng Xue, Lei Zhong, Zhe Chen, Deng-pan Xue, and Xiang-ning Li "Novel system for automatic measuring diopter based on ARM circuit block", Proc. SPIE 7381, International Symposium on Photoelectronic Detection and Imaging 2009: Material and Device Technology for Sensors, 73812E (24 August 2009); https://doi.org/10.1117/12.836003

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KEYWORDS

Light sources

LCDs

Cameras

Interfaces

Monochromatic aberrations

Control systems

Photorefraction

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