Paper
25 August 2009 Failure analysis and seal life prediction for contacting mechanical seals
J. J. Sun, X. Y. He, L. Wei, X. Feng
Author Affiliations +
Proceedings Volume 7375, ICEM 2008: International Conference on Experimental Mechanics 2008; 73753L (2009) https://doi.org/10.1117/12.839260
Event: International Conference on Experimental Mechanics 2008 and Seventh Asian Conference on Experimental Mechanics, 2008, Nanjing, China
Abstract
Fault tree analysis method was applied to quantitatively investigate the causes of the leakage failure of mechanical seals. It is pointed out that the change of the surface topography is the main reasons causing the leakage of mechanical seals under the condition of constant preloads. Based on the fractal geometry theory, the relationship between the surface topography and working time were investigated by experiments, and the effects of unit load acting on seal face on leakage path in a mechanical seal were analyzed. The model of predicting seal life of mechanical seals was established on the basis of the relationship between the surface topography and working time and allowable leakage. The seal life of 108 mechanical seal operating at the system of diesel fuel storage and transportation was predicted and the problem of the condition monitoring for the long-period operation of mechanical seal was discussed by this method. The research results indicate that the method of predicting seal life of mechanical seals is feasible, and also is foundation to make scheduled maintenance time and to achieve safe-reliability and low-cost operation for industrial devices.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. J. Sun, X. Y. He, L. Wei, and X. Feng "Failure analysis and seal life prediction for contacting mechanical seals", Proc. SPIE 7375, ICEM 2008: International Conference on Experimental Mechanics 2008, 73753L (25 August 2009); https://doi.org/10.1117/12.839260
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Cited by 2 scholarly publications and 1 patent.
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KEYWORDS
Fractal analysis

Failure analysis

Interfaces

Corrosion

Argon

Europium

Microfluidics

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