Paper
16 March 2009 Source optimization for three-dimensional image designs through film stacks
Author Affiliations +
Abstract
In this paper, we will outline the approach for optimizing the illumination conditions to print three-dimensional images in resist stacks of varying sensitivity in a single exposure. The algorithmic approach for acheiving both optimal common and weakest window is presented. Results will be presented which demonstrate the ability of the technique to create threedimensional structures. The performance of the common and weakest window formulation will be explored using this approach. Additionally, due to physical restrictions there are limitations to the type of patterns that can be printed with a single exposure in this manner, thus the abilities of such a technique will be explored.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David O. S. Melville, Alan E. Rosenbluth, Kehan Tian, Dario Goldfarb, Stefan Harrer, and Matthew Colburn "Source optimization for three-dimensional image designs through film stacks", Proc. SPIE 7274, Optical Microlithography XXII, 72743D (16 March 2009); https://doi.org/10.1117/12.814700
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Photomasks

3D image processing

Binary data

Radon

Lithography

Manufacturing

Tolerancing

RELATED CONTENT

Photonic curvilinear data processing
Proceedings of SPIE (October 29 2014)
Dense OPC for 65nm and below
Proceedings of SPIE (November 09 2005)

Back to Top