Front Matter: Volume 7160

doi:10.1117/12.819868

2 February 2009 Front Matter: Volume 7160

Proceedings Volume 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications; 716001 (2009) https://doi.org/10.1117/12.819868
Event: International Conference of Optical Instrument and Technology, 2008, Beijing, China

Abstract

This PDF file contains the front matter associated with SPIE Proceedings Volume 7160, including the Title Page, Copyright information, Table of Contents, Introduction, and the Conference Committee listing.

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"Front Matter: Volume 7160", Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 716001 (2 February 2009); https://doi.org/10.1117/12.819868

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