Paper
31 December 2008 Speckle and CCD noise in rotationally symmetric and anamorphic laser triangulation
Lei Wang, Jun Gao, Johannes Eckstein, Peter Ott
Author Affiliations +
Proceedings Volume 7130, Fourth International Symposium on Precision Mechanical Measurements; 71303P (2008) https://doi.org/10.1117/12.819692
Event: Fourth International Symposium on Precision Mechanical Measurements, 2008, Anhui, China
Abstract
As one kind of anamorphic laser triangulation displacement sensor, rotationally symmetric triangulation (RST) has a lot of advantages comparing to traditional ones. Laser speckle and CCD noise are also two fundamental uncertainty factors in this kind of sensors. The analytic expression of centroid uncertainty limit from speckle in RST sensor is derived in this paper. It is shown that the uncertainty limit in RST, and also in anamorphic triangulation, is dependent on the solid angle subtended by entrance pupil as seen from the illuminated laser spot, as well as the laser wavelength. Because it's very easy to get a bigger entrance pupil in RST than in traditional laser triangulation, the centroid uncertainty limit from speckle in RST is much smaller. The CCD noise in RST and anamorphic laser triangulation is dependent on photon shot noise, dark current, photo-response non-uniformity, and cross talk. The centroid uncertainty limit from CCD noise in this case is described by 1-D Cramer-Rao lower bound, and is also smaller than in traditional triangulation. By using more CCD pixels, RST is less sensitive to noise level. Results of simulation and experiments verify the result of deriving.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lei Wang, Jun Gao, Johannes Eckstein, and Peter Ott "Speckle and CCD noise in rotationally symmetric and anamorphic laser triangulation", Proc. SPIE 7130, Fourth International Symposium on Precision Mechanical Measurements, 71303P (31 December 2008); https://doi.org/10.1117/12.819692
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Cited by 2 scholarly publications.
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KEYWORDS
Charge-coupled devices

Speckle

Sensors

CCD image sensors

Signal to noise ratio

Distance measurement

Electrons

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