In-situ x-ray diffraction profiling of cracks and metal-metal interfaces at the nanoscale

Andrei Y. Nikulin; Aliaksandr V. Darahanau; Ruben A. Dilanian; Barry C. Muddle; Alexei Y. Souvorov; Osami Sakata

doi:10.1117/12.795952

18 September 2008 In-situ x-ray diffraction profiling of cracks and metal-metal interfaces at the nanoscale

Andrei Y. Nikulin, Aliaksandr V. Darahanau, Ruben A. Dilanian, Barry C. Muddle, Alexei Y. Souvorov, Osami Sakata

Proceedings Volume 7078, Developments in X-Ray Tomography VI; 70781M (2008) https://doi.org/10.1117/12.795952
Event: Optical Engineering + Applications, 2008, San Diego, California, United States

Abstract

High-angular-resolution Fraunhofer diffraction data were collected from several samples with interfaces between dissimilar metals and an artificial crack in a metal foil using synchrotron x-radiation. The refractive index profile in the vicinity of the interface and crack of each sample was reconstructed with spatial resolution of about 40-60 nm by the Phase Retrieval X-Ray Diffractometry technique, using only limited a priori knowledge of the sample. These studies have demonstrated the viability of the technique as an in-situ nondestructive method of characterization of internal interfaces within multiphase materials and crack developing under external force.

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Andrei Y. Nikulin, Aliaksandr V. Darahanau, Ruben A. Dilanian, Barry C. Muddle, Alexei Y. Souvorov, and Osami Sakata "In-situ x-ray diffraction profiling of cracks and metal-metal interfaces at the nanoscale", Proc. SPIE 7078, Developments in X-Ray Tomography VI, 70781M (18 September 2008); https://doi.org/10.1117/12.795952

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