Optical inspection for electronic assemblies using nonlinear correlation filters

Jorge L. Flores; G. García-Torales; Josué Álvarez Borrego

doi:10.1117/12.795597

15 September 2008 Optical inspection for electronic assemblies using nonlinear correlation filters

Jorge L. Flores, G. García-Torales, Josué Álvarez Borrego

Proceedings Volume 7073, Applications of Digital Image Processing XXXI; 707328 (2008) https://doi.org/10.1117/12.795597
Event: Optical Engineering + Applications, 2008, San Diego, California, United States

Abstract

This paper describes an image recognition system designed to inspect the standards quality of electronic assemblies. The essence of the present algorithm is the location of electronics components, at the input image, that disrupt the acceptance requirements for the manufacture of printed circuit board assemblies, which have been adopted by association connecting electronics industries. To this end, image processing modules, based on a nonlinear composite filter are employed with the objective to discriminate between the electronics components that meet the acceptance condition and those that are in defect condition. The proposed recognition system is based on nonlinear composite filter, which is obtained from a training set of reference images. Then, the optimal filter is used in a digital correlator, which results in a simple and robust inspection system.

Citation Download Citation

Jorge L. Flores, G. García-Torales, and Josué Álvarez Borrego "Optical inspection for electronic assemblies using nonlinear correlation filters", Proc. SPIE 7073, Applications of Digital Image Processing XXXI, 707328 (15 September 2008); https://doi.org/10.1117/12.795597

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KEYWORDS

Nonlinear filtering

Electronic components

Image filtering

Composites

Digital filtering

Capacitors

Inspection

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