Paper
29 April 2008 Influence of vacancy clusters on the adhesion properties of interfaces
R. Goldstein, T. Makhviladze, M. Sarychev
Author Affiliations +
Proceedings Volume 7025, Micro- and Nanoelectronics 2007; 70251R (2008) https://doi.org/10.1117/12.802539
Event: Micro- and Nanoelectronics 2007, 2007, Zvenigorod, Russian Federation
Abstract
In the work the influence of vacancy clusters on strength properties of solid-solid interfaces is studied on the base of the thermodynamic approach. The conditions of cluster formation at the interface are obtained and analyzed. A model describing the influence of vacancy clusters in the contacting materials on the surface tension coefficient γ12 of the interface is also developed. The dependences of the contribution of nonequilibrium vacancy clusters in γ12 on a vacancy supersaturation, cluster concentrations, the number of vacancies in clusters, and temperature are analyzed.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. Goldstein, T. Makhviladze, and M. Sarychev "Influence of vacancy clusters on the adhesion properties of interfaces", Proc. SPIE 7025, Micro- and Nanoelectronics 2007, 70251R (29 April 2008); https://doi.org/10.1117/12.802539
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KEYWORDS
Interfaces

Thermodynamics

Tantalum

Chemical species

Copper

Solids

Spherical lenses

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