Optical vortex metrology: Are phase singularities foes or friends in optical metrology?

Mitsuo Takeda; Wei Wang; Steen G. Hanson; Yoko Miyamoto

doi:10.1117/12.797345

22 April 2008 Optical vortex metrology: Are phase singularities foes or friends in optical metrology?

Mitsuo Takeda, Wei Wang, Steen G. Hanson, Yoko Miyamoto

Proceedings Volume 7008, Eighth International Conference on Correlation Optics; 70081G (2008) https://doi.org/10.1117/12.797345
Event: Eighth International Conference on Correlation Optics, 2007, Chernivsti, Ukraine

Abstract

We raise an issue whether phase singularities are foes or friends in optical metrology, and give an answer by introducing the principle and applications of a new technique which we recently proposed for displacement and flow measurements. The technique is called optical vortex metrology because it makes use of the unique characteristics of phase singularities as markers or tracers for the displacement and flow measurements. The phase singularities are created in the complex signal representation of a speckle-like random pattern, which is generated by means of a vortex filer operating a Riesz or Laguerre-Gauss transform to the random pattern.

Citation Download Citation

Mitsuo Takeda, Wei Wang, Steen G. Hanson, and Yoko Miyamoto "Optical vortex metrology: Are phase singularities foes or friends in optical metrology?", Proc. SPIE 7008, Eighth International Conference on Correlation Optics, 70081G (22 April 2008); https://doi.org/10.1117/12.797345

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