Dynamic displacement measurement of Low-E membrane reactor by PSD based on laser-triangulation method

Baoqiang Li; Tiegen Liu; Yao Zhang

doi:10.1117/12.757287

24 January 2008 Dynamic displacement measurement of Low-E membrane reactor by PSD based on laser-triangulation method

Baoqiang Li, Tiegen Liu, Yao Zhang

Proceedings Volume 6829, Advanced Materials and Devices for Sensing and Imaging III; 68291N (2008) https://doi.org/10.1117/12.757287
Event: Photonics Asia 2007, 2007, Beijing, China

Abstract

During the production of Low-E (Low-Emission) glass, the distance between Low-E membrane reactor and the float glass impacts the thickness of Low-E membrane coated, and the quality of products. The system, designed to measure the displacement of the reactor, which represents the distance between Low-E membrane reactor and the float glass, will work in the industrial condition of high temperature and strong interference. On the consideration of non-contact, noninvasive and high-speed, a measure system by PSD (Position Sensitive Detector) based on Laser-Triangulation method is designed and a prototype made. In this system, a laser beam, generated by a semiconductor laser generator, focuses on the underside surface of the Low-E membrane reactor made of graphite. And then, the laser spot on the underside surface, through a small focus lens, is detected by a 1D-PSD (One-Dimension Detector). The electric signal, reflecting the position of the small laser spot on the PSD, is amplified and processed by amplifier and signal processing circuit, then is sampled by a A/D converter. Based on the Laser-Triangulation method, the displacement can be computed. Trial shows, the system based on Laser-Triangulation method meets the requirements of high-speed, noninvasive, non-contact, and to some extent diminishes the influence of nonlinearity and dark current of the PSD.

Citation Download Citation

Baoqiang Li, Tiegen Liu, and Yao Zhang "Dynamic displacement measurement of Low-E membrane reactor by PSD based on laser-triangulation method", Proc. SPIE 6829, Advanced Materials and Devices for Sensing and Imaging III, 68291N (24 January 2008); https://doi.org/10.1117/12.757287

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
8 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Glasses

Sensors

Signal processing

Laser systems engineering

Optoelectronics

Signal detection

Laser processing

Show All Keywords

Keywords/Phrases

Search In:

Publication Years