Paper
29 October 2007 Time-of-flight 3D localization of fluorescent inclusions in thick turbid media with ultra-fast TCSPC APDs and electronics
Author Affiliations +
Proceedings Volume 6771, Advanced Photon Counting Techniques II; 677107 (2007) https://doi.org/10.1117/12.734882
Event: Optics East, 2007, Boston, MA, United States
Abstract
We herein describe a time-of-flight (TOF) technique to localize in 3D the position of a small fluorophore-filled inclusion immersed in a scattering medium. To achieve this, we exploit the arrival time of early excited and fluoresced photons. This is an embodiment of fluorescence diffuse optical tomography (FDOT) which aims to find the position of fluorescent heterogeneities in 3D in thick turbid media non-invasively via optical imaging techniques. In Ref. 4, we gave a short review of previous work on the problem of localizing a fluorescent inclusion via time-resolved measurements. This will not be discussed again here.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Vincent Robichaud and Yves Bérubé-Lauzière "Time-of-flight 3D localization of fluorescent inclusions in thick turbid media with ultra-fast TCSPC APDs and electronics", Proc. SPIE 6771, Advanced Photon Counting Techniques II, 677107 (29 October 2007); https://doi.org/10.1117/12.734882
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Sensors

Avalanche photodetectors

Luminescence

Scattering

Photons

3D-TOF imaging

3D metrology

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