Investigation of TlBr detector response under high-flux x-rays

Hadong Kim; Leonard Cirignano; Yuri Dmitriev; Mike Squillante; Philip Wong; Kanai Shah

doi:10.1117/12.734779

24 September 2007 Investigation of TlBr detector response under high-flux x-rays

Hadong Kim, Leonard Cirignano, Yuri Dmitriev, Mike Squillante, Philip Wong, Kanai Shah

Proceedings Volume 6706, Hard X-Ray and Gamma-Ray Detector Physics IX; 67061F (2007) https://doi.org/10.1117/12.734779
Event: Optical Engineering + Applications, 2007, San Diego, California, United States

Abstract

Thallium bromide (TlBr) is a compound semiconductor with high density, high atomic numbers and wide bandgap. In addition, recent results indicate that the mobility-lifetime product of electrons can be quite high, approaching the values for CdTe and CZT. These properties make TlBr a very promising material for nuclear radiation detector at room temperature. In this paper we report on our investigation of the performance of planar TlBr detector under high flux x-rays irradiation. This study proposes an alternate contact method that reduces the polarization effects, and the afterglow for a wide range of high flux applications.

Citation Download Citation

Hadong Kim, Leonard Cirignano, Yuri Dmitriev, Mike Squillante, Philip Wong, and Kanai Shah "Investigation of TlBr detector response under high-flux x-rays", Proc. SPIE 6706, Hard X-Ray and Gamma-Ray Detector Physics IX, 67061F (24 September 2007); https://doi.org/10.1117/12.734779

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