Paper
13 September 2007 High-resolution soft x-ray spectroscopy for constellation X
Charles Lillie, Webster Cash, Nahum Arav, J. Michael Shull, Jeffrey Linsky
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Abstract
The Constellation-X mission, with 5 to 10 times the collecting area of any previous x-ray observatory, will obtain high-throughput, high resolution spectroscopic observations of x-ray sources ranging from super-massive black holes to the disks around young stars in the 0.25-4.0 keV region of the spectrum. We describe the need for high resolution X-ray spectroscopy on the Constellation-X mission, the various options for obtaining it, and the implementation that we recommend;, e.g. an off-plane grating system that can simultaneously provide spectral resolutions (λ/δλ) as high as 3000 and substantially increased throughput in the 0.2 to 2.0 keV region. As a flagship mission, Constellation-X will be a general purpose facility for the astronomy community. The reflection grating system we describe will enable Constellation-X to address the important questions of the next generation within NASA's current cost target.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Charles Lillie, Webster Cash, Nahum Arav, J. Michael Shull, and Jeffrey Linsky "High-resolution soft x-ray spectroscopy for constellation X", Proc. SPIE 6686, UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XV, 668612 (13 September 2007); https://doi.org/10.1117/12.735473
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CITATIONS
Cited by 4 scholarly publications.
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KEYWORDS
X-rays

Spectroscopy

Optical design

Spectral resolution

Computer aided design

X-ray telescopes

X-ray astronomy

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