IR Material Characterization

J C Thuillier

doi:10.1117/12.938540

22 November 1986 IR Material Characterization

J C Thuillier

Author Affiliations +

Proceedings Volume 0659, Materials Technologies for Infrared Detectors; (1986) https://doi.org/10.1117/12.938540
Event: 1986 International Symposium/Innsbruck, 1986, Innsbruck, Austria

Abstract

Characterization is an important activity in the field of semiconductors. Many different methods are available using various physical effects. We focus this paper on the transport phenomena and an example of study is given on HgTe/CdTe super lattices.

Citation Download Citation

J C Thuillier "IR Material Characterization", Proc. SPIE 0659, Materials Technologies for Infrared Detectors, (22 November 1986); https://doi.org/10.1117/12.938540

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

;

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE