Measurement of modulation transfer function of infrared optoelectronic detector

Lei Liu; Bing Chen

doi:10.1117/12.723336

31 May 2007 Measurement of modulation transfer function of infrared optoelectronic detector

Lei Liu, Bing Chen

Proceedings Volume 6585, Optical Sensing Technology and Applications; 658525 (2007) https://doi.org/10.1117/12.723336
Event: International Congress on Optics and Optoelectronics, 2007, Prague, Czech Republic

Abstract

This paper details a method for measuring the MTF for optoelectronic detector. A description of a test facility for testing and evaluating MTF is given. We use a knife-edge target to measure MTF. The Pentium III computer system takes the charge of controlling and calculating.

Citation Download Citation

Lei Liu and Bing Chen "Measurement of modulation transfer function of infrared optoelectronic detector", Proc. SPIE 6585, Optical Sensing Technology and Applications, 658525 (31 May 2007); https://doi.org/10.1117/12.723336

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