Paper
9 April 2007 Experimental estimation of the recognition reliability in the optical pattern recognition systems
Veacheslav L. Perju, David P. Casasent, Igor A. Mardare, Oleg V. Chirca
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Abstract
A method of the recognition reliability estimation in the optical pattern recognition systems (OPRS) is described, based on of the similarity measures differences (SMD). It was theoretically justified and experimentally confirmed a hypothesis about the distribution law of the SMD. There were calculated the reliabilities of the correct objects recognition at single and coded correlation responses in OPRS of invariant and normalized images processing.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Veacheslav L. Perju, David P. Casasent, Igor A. Mardare, and Oleg V. Chirca "Experimental estimation of the recognition reliability in the optical pattern recognition systems", Proc. SPIE 6574, Optical Pattern Recognition XVIII, 65740N (9 April 2007); https://doi.org/10.1117/12.720177
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KEYWORDS
Reliability

Optical pattern recognition

Object recognition

Interference (communication)

Image processing

Statistical analysis

Signal to noise ratio

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