A novel method for uncertainty evaluation of roundness errors based on geometrical product specification

Jian Mao; Yanlong Cao; Jiangxin Yang; Xusong Xu

doi:10.1117/12.717175

6 November 2006 A novel method for uncertainty evaluation of roundness errors based on geometrical product specification

Jian Mao, Yanlong Cao, Jiangxin Yang, Xusong Xu

Author Affiliations +

Proceedings Volume 6357, Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence; 635738 (2006) https://doi.org/10.1117/12.717175
Event: Sixth International Symposium on Instrumentation and Control Technology, 2006, Beijing, China

Abstract

Roundness of circular and cylindrical parts can greatly affect assembly accuracy. It is essential to establish a proper method for evaluation roundness error to ensure achieving accurate assessment. According to the evaluation principle of roundness error and the uncertainty theory, a novel method for the uncertainty evaluation of roundness errors is proposed based on the new generation geometrical product specification (GPS). Under the condition of minimum zone, the mathematical model of roundness error and the optimal objective function were developed. Particle Swarm Optimization (PSO) algorithm was used to search for the optimal solution of roundness error. The uncertainties of each of coefficients which influenced the roundness error and of transfer coefficient were calculated in order to get the uncertainty of roundness error. The evaluation results accord with requirements of new generation GPS standard and indicate that this method can assure the integrity and veracity of evaluation.

Citation Download Citation

Jian Mao, Yanlong Cao, Jiangxin Yang, and Xusong Xu "A novel method for uncertainty evaluation of roundness errors based on geometrical product specification", Proc. SPIE 6357, Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 635738 (6 November 2006); https://doi.org/10.1117/12.717175

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available