The testing of responding time delay of the hybrid integrated circuit of PIN photodiode

Rongguo Fu; Bengkang Chang; Yuansheng Qian; YaFeng Qiu

doi:10.1117/12.687772

6 October 2006 The testing of responding time delay of the hybrid integrated circuit of PIN photodiode

Rongguo Fu, Bengkang Chang, Yuansheng Qian, YaFeng Qiu

Proceedings Volume 6352, Optoelectronic Materials and Devices; 63521R (2006) https://doi.org/10.1117/12.687772
Event: Asia-Pacific Optical Communications, 2006, Gwangju, South Korea

Abstract

The responding time delay characteristic of the detector of PIN photodiode is caused by the different intensity of the signal received by the detector. The responding time delay usually is less several tens nano-seconds. Aaccording to the principle of the responding time delay, the testing system is designed to measure the responding time delay. The test of responding time delay with different laser powers is carried on, and the result of the responding time delays is given.

Citation Download Citation

Rongguo Fu, Bengkang Chang, Yuansheng Qian, and YaFeng Qiu "The testing of responding time delay of the hybrid integrated circuit of PIN photodiode", Proc. SPIE 6352, Optoelectronic Materials and Devices, 63521R (6 October 2006); https://doi.org/10.1117/12.687772

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