Paper
22 June 2006 Determination of the crystallization parameters of phase change materials in optical recording
Gongming Wei, Bas Feddes
Author Affiliations +
Proceedings Volume 6282, Optical Data Storage 2006; 628220 (2006) https://doi.org/10.1117/12.685191
Event: Optical Data Storage 2006, 2006, Montréal, Canada
Abstract
Two methods are developed to determine the crystallization parameters of phase change materials on mark formation in phase change optical recording. Both methods are based on the comparison of experimental and numerical modeling results. In the first method, the shape of short written marks is compared in experiment and simulation. In the second method, long marks are partially erased. The resulted mark shape reveals information on the crystallization parameter. The set of crystallization properties in the simulation that gives the best match between experimental and numerical results can describe the crystallization behavior of the phase change material. The determined crystallization parameters and model give excellent predictions on mark formation and erasure in growth-dominated phase change materials.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gongming Wei and Bas Feddes "Determination of the crystallization parameters of phase change materials in optical recording", Proc. SPIE 6282, Optical Data Storage 2006, 628220 (22 June 2006); https://doi.org/10.1117/12.685191
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KEYWORDS
Crystals

Transmission electron microscopy

Optical recording

Interfaces

Thermal modeling

Modulation

Calibration

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