Paper
15 March 2006 SIBS: a powerful concept for automatic segmentation of electron tomograms
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Abstract
A scaling index based segmentation (SIBS) method is proposed in order to improve visualization and interpretation of data obtained by electron tomography. Based on the interpretation of the scaling index as a measure for dimensionality, the pixels/voxels of an image/volume are subdivided into different categories according to the kind of structure they belong to. Using the weighted scaling index method proposed by Räth1 in conjunction with morphological operators, the approach was adapted to the field of electron microscopy, especially to three-dimensional application as needed by electron tomography. The method turns out to be quite effective for linear structures and membranes. Theory, implementation, parameter settings and results obtained with different kinds of data are presented and discussed.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alexandros A. Linaroudis and Reiner Hegerl "SIBS: a powerful concept for automatic segmentation of electron tomograms", Proc. SPIE 6144, Medical Imaging 2006: Image Processing, 61443H (15 March 2006); https://doi.org/10.1117/12.648883
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KEYWORDS
Image segmentation

3D image processing

Electron tomography

Signal to noise ratio

Binary data

Visualization

Tomography

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