Quantitative evaluation of mercuric iodide thick film for x-ray imaging device

Kyung-Jin Kim; Sang-Sik Kang; Ji-Koon Park; Sung-Ho Cho; Byung-Youl Cha; Jung-Wook Shin; Sang-Hee Nam; Jae-Hyung Kim

doi:10.1117/12.653002

2 March 2006 Quantitative evaluation of mercuric iodide thick film for x-ray imaging device

Kyung-Jin Kim, Sang-Sik Kang, Ji-Koon Park, Sung-Ho Cho, Byung-Youl Cha, Jung-Wook Shin, Sang-Hee Nam, Jae-Hyung Kim

Proceedings Volume 6142, Medical Imaging 2006: Physics of Medical Imaging; 61422Z (2006) https://doi.org/10.1117/12.653002
Event: Medical Imaging, 2006, San Diego, California, United States

Abstract

In this paper, we investigated electrical characteristics of the X-ray detector of mercuric iodide (HgI₂) film fabricated by PIB(Particle-In-Binder) Method with thicknesses ranging from approximately 200μm to 240μm. In the present study, using I-V measurements, their electrical properties such as leakage current, X-ray sensitivity, and signal-to-noise ratio (SNR),were investigated. The results of our study can be useful in the future design and optimization of direct active-matrix flat-panel detectors (AMFPD) for various digital X-ray imaging modalities.

Citation Download Citation

Kyung-Jin Kim, Sang-Sik Kang, Ji-Koon Park, Sung-Ho Cho, Byung-Youl Cha, Jung-Wook Shin, Sang-Hee Nam, and Jae-Hyung Kim "Quantitative evaluation of mercuric iodide thick film for x-ray imaging device", Proc. SPIE 6142, Medical Imaging 2006: Physics of Medical Imaging, 61422Z (2 March 2006); https://doi.org/10.1117/12.653002

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